EPP Small Experiments Document 302-v1

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Map of first FPIX2.1 wafer probed - thin

Document #:
EPP-doc-302-v1
Document type:
Memo
Submitted by:
David Christian
Updated by:
David Christian
Document Created:
07 Dec 2006, 08:17
Contents Revised:
07 Dec 2006, 08:17
Metadata Revised:
05 Apr 2007, 10:04
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  • Public document
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Abstract:
Albert Dyer probed one of the original batch of FPIX2.1/TripT wafers that was produced in summer, 2005. The wafer was (or will be) sent to IZM for thinning.

The yield of good FPIX2.1 chips is ~70% (89 good).

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Notes and Changes:
We found that in order to get reproducable discriminator threshold curves, we needed to adjust Vdda to get a specific current draw. We believe that this is because there is a voltage drop at the probe contacts to the chips that matters for the analog voltage.
Referenced by:
  • EPP-doc-360: FPIX2.1 Thin Wafer Test Results (W62443-11F7)
  • EPP-doc-361: FPIX2.1 Wafer Test Results (FNAL-owned wafers)
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