EPP Small Experiments Document 16-v1

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CMS Pixel Simulation

Document #:
EPP-doc-16-v1
Document type:
Talk
Submitted by:
David Christian
Updated by:
David Christian
Document Created:
11 Nov 2005, 06:48
Contents Revised:
11 Nov 2005, 06:48
Metadata Revised:
11 Nov 2005, 06:48
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Abstract:
Presented at Vertex 2005 in Nikko by Vincenzo Chiochia (Zurich). "Two trap model" reproduces pattern of charge sharing seen as a function of applied voltage in irradiated sensors. Convincing evidence is given that junctions exist on both sides of the sensor and that the space charge density is not uniform in a "fully depleted" sensor after radiation damage.
Files in Document:
  • ppt (VERTEX05_Chiochia.ppt, 7.1 MB)
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