EPP Small Experiments Document 12-v1

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Radiation tolerant epitaxial silicon detectors of different thickness

Document #:
EPP-doc-12-v1
Document type:
Talk
Submitted by:
Ronald Lipton
Updated by:
Ronald Lipton
Document Created:
27 Oct 2005, 11:19
Contents Revised:
27 Oct 2005, 11:19
Metadata Revised:
28 Oct 2005, 11:14
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Abstract:
RD50 studies of 25 and 50 micron thick epitaxial material
radiation hardness.
Author = E. Fretwurst
Files in Document:
  • pdf (Helsinki-EPI-Fretwurst.pdf, 751.0 kB)
Topics:
Keywords:
pixel
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